Alexandre Reinhardt, CEA-LETI, France
Amelie Hagelauer, Friedrich-Alexander University, Germany
Ashwin Seshia, University of Cambridge, UK
Azadeh Ansari, Georgia Tech, USA
Ben Griffin, Sandia, USA
Bernd W. Neubig, Adv. Crystal Products, USA
Dan Stevens, Consultant, USA
Dr. Cristian Cassella, Northeastern University, USA
Emmanuel Defay, Luxembourg Institute of Science and Technology, Luxembourg
Jeffrey Pulskamp, US Army Research Labs , USA
Ken Hashimoto, Chiba University, Japan
Marc Faucher, IEMN, France
Matteo Rinaldi, Northeastern University, USA
Max Zeng-Hui Wang, University of Electronic Science and Technology of China, China
Olivier Le Traon, ONERA, France
Randy Kubena, HRL Laboratories, USA
Shuji Tanaka, Tohoku University, Japan
Songbin Gong, University of Illinois at Urbana-Champaign, USA
Tanay Gosavi, Intel, USA
Thomas Baron, FEMTO-ST, France
Ventsislav Yantchev, Chalmers University of Technology, Sweden
Wei-Chang Li , National Taiwan University, Taiwan
Yook-Kong Yong, Rutgers University, USA
Yoonkee Kim, US Army CERDEC, USA
Bichoy Bahr, Kilby Labs, Texas Instruments, USA
Claudio Calosso, INRIM, Italy
Craig Nelson, NIST, USA
David Howe, NIST, USA
Enrico Rubiola, FEMTO-ST, France
Fabrice Stahl, Femto-ST, France
Gilles Cibiel, CNES, France
Jean-Pierre Aubry, AubryConseil, Switzerland
Jeremy Everard, York University, UK
Magnus Danielson, Net Insight, USA
Markus Lutz, Si Time, USA
Michael Driscoll, Consultant, USA
Michael Tobar, University of Western Australia, Australia
Michael Underhill, Underhill Research Limited, UK
Olivier Llopis, LAAS, France
Paul P. Sotiriadis, University of Athens, Greece
Sarah Bedair, US Army Research Labs, USA
Serge Galliou, FEMTO-ST, France
Wan-Thai Hsu, TXC Corporation, USA
Arnaud Landragin, SYRTE, France
Bruno Pelle, Muquans, France
David Howe, NIST, USA
Elizabeth, NIST, USA
Eric Burt, JPL, USA
Fang Fang, NIM, China
Filippo Levi, INRIM, Italy
Francois-Xavier Esnault, CNES, France
Gaetano Mileti, Universite de Neuchatel, Switzerland
John Kitching, NIST, USA
Krzysztof Szymaniec, NPL, UK
Kurt Gibble, Penn State University, USA
Liang Liu, SIOM, China
Luca Lorini, LNE-SYRTE, France
Marco Belloni, ESA, Italy
Motohiro Kumagai, NICT, Japan
Qinghua Wang, Spectratime, Switzerland
Robert Lutwak, AFRL, USA
Robert Tjoelker, JPL, USA
Rodolphe Boudot, FEMTO-ST, France
Salvatore Micalizio, INRIM, Italy
Scott Crane, U.S. Naval Research Laboratory, USA
Stefan Weyers, PTB, Germany
Tom McCleland, FEI, USA
Tom Swanson, USNO, USA
Alfred Binder, CTR AG, Austria
Ashwin Seshia, University of Cambridge, UK
Bob Tingley, Draper, USA
Fabien Josse, Marquette University, USA
Greg Weaver, Johns Hopkins APL, USA
Guillermo Villanueva, Ecole Polytechnique Federal de Lausanne, Switzerland
Hanna Cho, Ohio State University, USA
Harris Hall, AFRL, USA
Jérôme Juilliard, Centrale/Supelec, France
Laura Popa, Analog Devices, USA
Laurent Duraffourg, CEA-Leti, France
Leonhard Reindl, Uni Freiburg, Germany
Mauricio Pereira da Cunha, University of Maine, USA
Michael Kraft, Univ of Liege, Belgium
Nithin Raghunathan, Purdue University, USA
Paul Muralt, EPFL, Switzerland
Philip Feng, Case Western Reserve University, USA
Ralf Lucklum, Universität Magdeburg, Germany
Ruonan Liu, Broadcom, USA
Sid Ghosh, MIT Lincoln Labs, USA
Sid Tallur, IIT Mumbai, India
Steven Tin, Honeywell Aerospace, USA
Sunil Bhave, Purdue University, USA
Sylvain Ballandras, Frecnsys, France
Ventsislav Yantchev, Uppsala Observatory, Sweden
Xiyuan Lu, NIST, USA
Aimin Zhang, NIM, China
Amitava Sen Gupta, NPLI, India
Andreas Bauch, PTB, Germany
Anne Amy-Klein, LPL, France
Bijunath Patla, NIST, USA
Daniel Varela Magalhães, University of São Paulo, Brazil
Davide Calonico, INRIM, Italy
Ed Powers, USNO, USA
Gesine Grosche, PTB, Germany
Guilherme de Andrade Garcia, INMETRO, Brazil
Hongbo Wang, BIRM, China
Huang-Tien Lin, NTFSL - TL, Taiwan
Jay Hanssen, USNO, USA
Judah Levine, NIST, USA
Laurent-Guy Bernier, METAS, Switzerland
Marina Gertsvolf, NRC, Canada
Michael Wouters, NMI, Australia
Miho Fujieda, NICT, Japan
Nathan Newbury, NIST, USA
Pascale Defraigne, ORB, Belgium
Per Olof Hedekvist, SP, Sweden
Peter Whibberley, NPL, UK
Pierre Ulrich, OBSPM, France
Pierre Waller, ESA-ESTEC, The Netherlands
Shinn-Yan Lin (Calvin), TW, Taiwan
Stefania Romisch, NIST, USA
Victor Zhang, NIST, USA
Vitaly Pal'chikov, VNIIFTRI, Russia
Wolfgang Schaefer, Timetech, Germany
Xiao Chun Lu, NTSC, China
Alexey Taichenachev, Institute of Laser Physics, Russia
Andre Luiten, University of Adelaide, Australia
Andrew Ludlow, NIST, USA
Christian Lisdat, PTB, Germany
Dave Leibrandt, NIST, USA
Davide Calonico, INRIM, Italy
Ekkehard Peik, PTB, Germany
Franklyn Quinlan, NIST, USA
Helen Margolis, NPL, UK
Jacques Morel, METAS, Switzerland
James Chou, NIST, USA
Jérôme Lodewyck, LNE-SYRTE, France
John McFerran, University of West Australia, Australia
Lin Yi, JPL, USA
Long-Sheng Ma, East China Normal University, China
Luigi Cacciapuoti, ESA, The Netherlands
Marty Boyd, USA
Masami Yasuda, AIST/NMIJ, Japan
Patrick Gill, NPL, UK
Pierre Dubé, NRC, Canada
Rachel Godun, NPL, UK
Rodolphe Le Targat, SYRTE, France
Roman Ciuryło, Nicolaus Copernicus University, Poland
Steve Lecomte, CSEM, Switzerland
Tara Fortier, NIST, USA
Tetsuya Ido, NICT, Japan
Thomas Südmeyer, LTF-UNINE, Switzerland
Tom Loftus, Honeywell, USA
Yann Le Coq, LNE-SYRTE, France
